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IRIS è il sistema di gestione integrata dei dati della ricerca (persone, progetti, pubblicazioni, attività) adottato dall'Università degli Studi di Cagliari dal mese di luglio 2015.

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TitoloData di pubblicazioneAutore(i)RivistaEditore
Peculiar failure mechanisms in GaN power transistors2020Vanzi, M.; Mura, G.MICROELECTRONICS RELIABILITY
Optical gain in laser diodes with null reflectivity2019Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y.MICROELECTRONICS RELIABILITY
Further improvements of an extended Hakki-Paoli method2018Vanzi, M.; Mura, G.; Martines, G.MICROELECTRONICS RELIABILITY
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices2018Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, BrunoJOURNAL OF ELECTRONIC MATERIALS
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes2018Vanzi, M.; Mura, G.; Sanna Valle, V.SPIE
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers2017Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M.IEEE (Institute of Electrical and Electronics Engineers)
Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress2017De Santi, Carlo; Meneghini, Matteo; Renso, Nicola; Buffolo, Matteo; Trivellin, Nicola; Mura, Giov...anna; Vanzi, Massimo; Migliori, Andrea; Morandi, Vittorio; Meneghesso, Gaudenzio; Zanoni, EnricoPROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERINGSPIE
Practical optical gain by an extended Hakki-Paoli method2017Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L.MICROELECTRONICS RELIABILITY
Extended Modal Gain Measurement in DFB Laser Diodes2017Vanzi, M; Marcello, G; Mura, G; Le Gales, G; Joly, S; Deshayes, Y; Bechou, LIEEE PHOTONICS TECHNOLOGY LETTERS
Analysis of GaN based high-power diode lasers after singular degradation events2017Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W.PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS
ESD tests on 850 nm GaAs-based VCSELs2016Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K.MICROELECTRONICS RELIABILITY
Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre2016Mannu, C.; Rodriguez, G.; Vanzi, . M.Condaghes
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue2016Mura, Giovanna; Vanzi, MassimoInstitute of Electrical and Electronics Engineers Inc.
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes2016De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Ga...udenzio; Zanoni, EnricoIEEE TRANSACTIONS ON NANOTECHNOLOGY
Side-Mode Excitation in Single-Mode Laser Diodes2016Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, GiovannaIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Clamp voltage and ideality factor in laser diodes2015Vanzi, M.; Mura, G.; Marcello, G.; Martines, G.MICROELECTRONICS RELIABILITY
Proton irradiation effects on commercial laser diodes2015Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, ...AlessandroInstitute of Electrical and Electronics Engineers Inc.
Recent improvements in photometric stereo for rock art 3D imaging2015Dessì R; Mannu C; Rodriguez G; Tanda G; Vanzi MDIGITAL APPLICATIONS IN ARCHAEOLOGY AND CULTURAL HERITAGE
Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna2015Mannu, C; Rodriguez, Giuseppe; Tanda, Giuseppa; Vanzi, MassimoEdizioni del Centro - Centro Camuno di Studi Preistorici
Reliability issues in Optical Emitters2015Vanzi, Massimo; Mura, GiovannaIEEE Computer Society
Ideality factor and threshold voltage in laser diodes2014Vanzi M; MURA G; Marcello G
Reliability prediction and real world for LED lamps2014MURA G; VANZI MIEEE (Institute of Electrical and Electronics Engineers, Inc.)
Photometric stereo for 3D mapping of carvings and relieves: case studies on prehistorical art in Sardinia2014Vanzi, M; Mannu, C; Dessì, R; Rodriguez, G; Tanda, GÂNGULO
FIB-induced electro-optical alterations in a DFB InP laser diode2014Mura G; Vanzi M; Marcello GMICROELECTRONICS RELIABILITY
XEBIC at the Dual Beam2013Vanzi M; Podda S; Musu E; Cao RMICROELECTRONICS RELIABILITY
Faulty failure analyses2013MURA G; VANZI MIEEE
The role of the optical trans-characteristics in laser diode analysis2013Mura G.; VANZI M; Marcello G.; Cao R.MICROELECTRONICS RELIABILITY
Optical losses in single-mode laser diodes2013Vanzi M; Mura G.; Marongiu M.; Tomasi T.MICROELECTRONICS RELIABILITY
“Hot-plugging” of led modules: electrical characterization and device degradation2013Dal Lago M; Meneghini M; Trivellin N; Mura G; Vanzi M; Meneghesso G; Zanoni EMICROELECTRONICS RELIABILITY
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells2013COMPAGNIN A; MENEGHINI M; BARBATO M; GILIBERTO V; CESTER A; VANZI M; MURA G; ZANONI E; MENEGHESSO GMICROELECTRONICS RELIABILITY
Chip and package-related degradation of high power white LEDs2012Meneghini M; Dal Lago M; Trivellin N; MURA G; Vanzi M; Menegnesso G; Zanoni EMICROELECTRONICS RELIABILITY
Phosphors for LED-based light sources: Thermal properties and reliability issues2012Dal Lago M; Meneghini M; Trivellin N; Mura G; Vanzi M; Meneghesso G; Zanoni EMICROELECTRONICS RELIABILITY
External cavity ITLA degradation2012MURA G; M.Vanzi; G.Martines; T.Tomasi; R.Cao; M.Marongiu
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps2012M. Meneghini; M. Bertin; G. dal Santo; A. Stocco; A. Chini; D. Marcon; P.E. Malinowski; MURA G; E.... Musu; M. Vanzi; G. Meneghesso; E. Zanoni
An original DoE-based tool for silicon photodetectors EoL estimation in space environments2011Vanzi M; Spezzigu P; Bechou L; Quadri G; Gilard O; Ousten YMICROELECTRONICS RELIABILITYElsevier
Implementation of TV-rate EBIC at a Dual BEam2011VANZI M; Podda S.; Tatti F.
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics2011Vanzi M; Podda SElisabetta Falcieri
DC parameters for laser diodes from experimental curves2011Vanzi M; Mura G; Martines GMICROELECTRONICS RELIABILITYElsevier
Optimized "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment2010QUADRI G; P. SPEZZIGU; C. CADDEO; O. GILARD; L. BECHOU; VANZI M
Degradation mechanisms of white LEDs for lighting applications2010M.MENEGHINI; M. DAL LAGO; L. RODIGHIERO; MURA G; M. VANZI; G. MENEGHESSO
3D reconstruction of FIB microstructures by Photometric Stereo at the SEM2010S.PODDA; R.PINTUS; E.MUSU; VANZI MRoyal microscopy society
Faulty Failure Analyses2010G.MURA; VANZI M
Prediction of Phototransistor Spectral Responsivity Degradation in a Space Environment using DOE methodology2010SPEZZIGU P; L. BECHOU; G. QUADRI; O. GILARD; C. CADDEO; Y. OUSTEN; VANZI M
3D reconstruction of FIB microstructures from BSE images2010PODDA S; R. PINTUS; E. MUSU; M.VANZI
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis2010Mura G; Vanzi MMICROELECTRONICS RELIABILITY
Trapped mobile charges effects on electrooptical performances in silicon phototransistors for space applications2009P. SPEZZIGU; G. QUADRI; O. GILARD; L. BECHOU; Y. OUSTEN; VANZI M
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs2009Meneghesso G; Meneghini M; Trivellin N; Rodighiero L; Mura G; Vanzi M; Zanoni E
Customized and highly reliable channel phototransistor array for aerospace optical encoders2009M. BREGOLI; A. MAGLIONE; A. COLLINI; P. BELLUTTI; P. SPEZZIGU; L.BECHOU; VANZI M
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices2009MURA G; VANZI MMICROELECTRONICS RELIABILITY
Implementation of a "Design of experiments" methodology for the prediction of phototransistor degradation in a space environment2009Spezzigu P; Caddeo C; Quadri G; Gilard O; Bechou L; Ousten Y; Vanzi MIEEE TRANSACTIONS ON NUCLEAR SCIENCE
   
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