Prodotti della ricerca
UNICA IRIS Institutional Research Information System
IRIS è il sistema di gestione integrata dei dati della ricerca (persone, progetti, pubblicazioni, attività) adottato dall'Università degli Studi di Cagliari dal mese di luglio 2015.
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Clamp voltage and ideality factor in laser diodes | 2015 | Vanzi, M.; Mura, G.; Marcello, G.; Martines, G. | MICROELECTRONICS RELIABILITY | |
| Reliability issues in Optical Emitters | 2015 | Vanzi, Massimo; Mura, Giovanna | IEEE Computer Society | |
| Stress-induced instabilities of shunt paths in high efficiency MWT solar cells | 2015 | Barbato, M. ; Meneghini, M. ; Cester, A. ; Barbato, A. ; Zanoni, E. ; Meneghesso, G. ; Mura, G. ;... Tonini, D. ; Voltan, A. ; Cellere, G. | ||
| Proton irradiation effects on commercial laser diodes | 2015 | Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, ...Alessandro | Institute of Electrical and Electronics Engineers Inc. | |
| Side-Mode Excitation in Single-Mode Laser Diodes | 2016 | Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | |
| ESD tests on 850 nm GaAs-based VCSELs | 2016 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K. | MICROELECTRONICS RELIABILITY | |
| Logics of Failure Analysis: 20 Years of rules of the Rue Morgue | 2016 | Mura, Giovanna; Vanzi, Massimo | Institute of Electrical and Electronics Engineers Inc. | |
| Single Event Transient acquisition and mapping for space device Characterization | 2016 | Pilia, Roberta; Bascoul, Guillaume; Sanchez, Kevin; Mura, Giovanna; Infante, Fulvio | MICROELECTRONICS RELIABILITY | |
| Reverse bias degradation of metal wrap through silicon solar cells | 2016 | Barbato, M.; Barbato, A.; Meneghini, M.; Cester, A.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cell...ere, G.; Meneghesso, G. | SOLAR ENERGY MATERIALS AND SOLAR CELLS | |
| Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes | 2016 | De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Ga...udenzio; Zanoni, Enrico | IEEE TRANSACTIONS ON NANOTECHNOLOGY | |
| Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities | 2017 | Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M. | MICROELECTRONICS RELIABILITY | |
| Practical optical gain by an extended Hakki-Paoli method | 2017 | Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. | MICROELECTRONICS RELIABILITY | |
| Analytical model for the I-V characteristics of fresh and degraded commercial LEDs | 2017 | Mura, G.; E., Miranda | ||
| Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress | 2017 | De Santi, Carlo; Meneghini, Matteo; Renso, Nicola; Buffolo, Matteo; Trivellin, Nicola; Mura, Giov...anna; Vanzi, Massimo; Migliori, Andrea; Morandi, Vittorio; Meneghesso, Gaudenzio; Zanoni, Enrico | PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING | SPIE |
| Extended Modal Gain Measurement in DFB Laser Diodes | 2017 | Vanzi, M; Marcello, G; Mura, G; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L | IEEE PHOTONICS TECHNOLOGY LETTERS | |
| Analysis of GaN based high-power diode lasers after singular degradation events | 2017 | Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. | PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS | |
| Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers | 2017 | Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. | IEEE (Institute of Electrical and Electronics Engineers) | |
| Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices | 2018 | Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno | JOURNAL OF ELECTRONIC MATERIALS | |
| Reliability concerns from the gray market | 2018 | Mura, Giovanna | MICROELECTRONICS RELIABILITY | |
| Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes | 2018 | Vanzi, M.; Mura, G.; Sanna Valle, V. | SPIE | |
| Further improvements of an extended Hakki-Paoli method | 2018 | Vanzi, M.; Mura, G.; Martines, G. | MICROELECTRONICS RELIABILITY | |
| From automotive to space qualification: Overlaps, gaps and possible convergence | 2018 | Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G. | IEEE (Institute of Electrical and Electronics Engineers) | |
| Optical gain in laser diodes with null reflectivity | 2019 | Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. | MICROELECTRONICS RELIABILITY | |
| Analysis of counterfeit electronics | 2020 | Mura, G.; Murru, R.; Martines, G. | MICROELECTRONICS RELIABILITY |
