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IRIS è il sistema di gestione integrata dei dati della ricerca (persone, progetti, pubblicazioni, attività) adottato dall'Università degli Studi di Cagliari dal mese di luglio 2015.

Mostra risultati da 1 a 50 di 73
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TitoloData di pubblicazioneAutore(i)RivistaEditore
Are Soft-Breakdown and Hard-Breakdown of thin gate oxides actually different failure mechanism2000J. SUÑÈ; MURA G; E. MIRANDAIEEE ELECTRON DEVICE LETTERS
An automated lifetest equipment for optical emitters2002GIGLIO M; MARTINES G; MURA G; PODDA S; VANZI MMICROELECTRONICS RELIABILITY
Electrical and structural characterization of metal contacts on Gallium Nitride2002Bonfiglio A; Macis E; Mura G; Sanna O
Failure modes and mechanisms of DC-aged GaN LEDs2002Meneghesso G; Levada S; Zanoni E; Podda S; Mura G; Vanzi M; Cavallini A; Castaldini A; Du S; Elia...shevich I
Backside Failure Analysis of GaAs ICs after EDS tests2002Meneghesso, G; Cocco, A; Mura, Giovanna; Podda, Simona; Vanzi, MassimoMICROELECTRONICS RELIABILITY
Failure modes and mechanisms of DC-aged GaN LEDs2002Meneghesso, G.; Levada, S.; Zanoni, E.; Podda, S.; Mura, G.; Vanzi, M.; Cavallini, A.; Castaldini..., A.; Du, S.; Eliashevich, I.PHYSICA STATUS SOLIDI. A, APPLIED RESEARCH
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology2002L. SPONTON; L.CERATI; G.CROCE; MURA G; S.PODDA; M.VANZI; G. MENEGHESSOMICROELECTRONICS RELIABILITY
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices2003MURA G; VANZI M; CIAPPA M; STANGONI M; FICHTNER WMICROELECTRONICS RELIABILITY
Reliability of visible GaN LEDs in plastic package2003G. MENEGHESSO; S. LEVADA; E. ZANONI; G. SCAMARCIO; G. MURA; PODDA S; M. VANZI; S. DU; I. ELIASHE...VICHMICROELECTRONICS RELIABILITY
Analysis of RFIC Amplifiers2004MURA G; M.VANZI; G. MICHELETTIMICROELECTRONICS RELIABILITY
Failure analysis of RFIC Amplifiers2004VANZI M; MICHELETTI G.; MURA G.MICROELECTRONICS RELIABILITY
Reliability predictions in electronic industrial applications2005Cassanelli G; Mura G; Cesaretti F; Vanzi M; Fantini FMICROELECTRONICS RELIABILITY
Brightness InGaN LEDs degradation at high injection current bias2006LEVADA S; MENEGHINI M; ZANONI E; BUSO S; SPIAZZI G; MENEGHESSO G; PODDA S; MURA G; VANZI M
Failure Analysis And Field Failures: A Real Shortcut To Reliability Improvements2006MURA G; G. Cassanelli
High Brightness InGaN LEDs degradation at high injection current bias2006S. Levada; M. Meneghini; E. Zanoni; S. Buso; G. Spiazzi; Meneghesso G; MURA G; S. Podda; M. Vanzi
The rules of the Rue Morgue: a decade later2006MURA G; VANZI M; CASSANELLI G; FANTINI F
Failure Analysis-assisted FMEA2006CASSANELLI G; FANTINI F; MURA G; VANZI M; PLANO BMICROELECTRONICS RELIABILITY
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later2007Mura G; Vanzi MIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
High temperature electro-optical degradation of InGaN/GaN HBLEDs2007M. MENEGHINI; L. TREVISANELLO; C. SANNA; G. MURA; G. MENEGHESSO; VANZI M; ZANONI E.MICROELECTRONICS RELIABILITY
Thermal stability analysis of High Brightness LED during high temperature and electrical aging2007L.R. Trevisanello; M. Meneghini; MURA G; C. Sanna; S. Buso; G. Spiazzi; M. Vanzi; G. Meneghesso; ...E. Zanoni
Accelerated Life Test of High Brightness Light Emitting Diodes2008L. TREVISANELLO; M. MENEGHINI; MURA G; M. VANZI; M. PAVESI; G. MENEGHESSO; E. ZANONIIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels2008MURA G; L. TREVISANELLO; M. VANZI; G. MENEGHESSO; E. ZANONI
Failure Analysis of High Power White LEDs2008G. CASSANELLI; F. FANTINI; MURA G
Sulfur-contamination of High Power White LEDs2008MURA G; CASSANELLI G; FANTINI F; VANZI MMICROELECTRONICS RELIABILITY
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs2009Meneghesso G; Meneghini M; Trivellin N; Rodighiero L; Mura G; Vanzi M; Zanoni E
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices2009MURA G; VANZI MMICROELECTRONICS RELIABILITY
Faulty Failure Analyses2010G.MURA; VANZI M
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis2010Mura G; Vanzi MMICROELECTRONICS RELIABILITY
Degradation mechanisms of white LEDs for lighting applications2010M.MENEGHINI; M. DAL LAGO; L. RODIGHIERO; MURA G; M. VANZI; G. MENEGHESSO
A review on the physical mechanisms that limit the reliability of GaN-based LEDs2010MATTEO MENEGHINI; AUGUSTO TAZZOLI; GAUDENZIO MENEGHESSO; MURA GIOVANNA; ENRICO ZANONIIEEE TRANSACTIONS ON ELECTRON DEVICES
DC parameters for laser diodes from experimental curves2011Vanzi M; Mura G; Martines GMICROELECTRONICS RELIABILITYElsevier
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps2012M. Meneghini; M. Bertin; G. dal Santo; A. Stocco; A. Chini; D. Marcon; P.E. Malinowski; MURA G; E.... Musu; M. Vanzi; G. Meneghesso; E. Zanoni
Chip and package-related degradation of high power white LEDs2012Meneghini M; Dal Lago M; Trivellin N; MURA G; Vanzi M; Menegnesso G; Zanoni EMICROELECTRONICS RELIABILITY
MIM Capacitor_related early-stage field failures2012LU J; CAO B; WU W; DAI Y; HUANG C; MURA GMICROELECTRONICS RELIABILITY
Phosphors for LED-based light sources: Thermal properties and reliability issues2012Dal Lago M; Meneghini M; Trivellin N; Mura G; Vanzi M; Meneghesso G; Zanoni EMICROELECTRONICS RELIABILITY
External cavity ITLA degradation2012MURA G; M.Vanzi; G.Martines; T.Tomasi; R.Cao; M.Marongiu
Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi2013Musu E.; MURA G; Ligios G.; Delogu F.JOURNAL OF ALLOYS AND COMPOUNDS
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence2013M. MENEGHINI; S. CARRARO; G. MENEGHESSO; N. TRIVELLIN; MURA G; F. ROSSI; G. SALVIATI; K. HOLC; T.... WEIG; L. SCHADE; M. A. KARUNAKARAN; J. WAGNER; U. T. SCHWARZ; AND E. ZANONIAPPLIED PHYSICS LETTERS
Optical losses in single-mode laser diodes2013Vanzi M; Mura G.; Marongiu M.; Tomasi T.MICROELECTRONICS RELIABILITY
“Hot-plugging” of led modules: electrical characterization and device degradation2013Dal Lago M; Meneghini M; Trivellin N; Mura G; Vanzi M; Meneghesso G; Zanoni EMICROELECTRONICS RELIABILITY
The role of the optical trans-characteristics in laser diode analysis2013Mura G.; VANZI M; Marcello G.; Cao R.MICROELECTRONICS RELIABILITY
Faulty failure analyses2013MURA G; VANZI MIEEE
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells2013COMPAGNIN A; MENEGHINI M; BARBATO M; GILIBERTO V; CESTER A; VANZI M; MURA G; ZANONI E; MENEGHESSO GMICROELECTRONICS RELIABILITY
Early stages of the mechanical alloying of TiC-TiN powder mixtures2013Mura G; Musu E; Delogu FMATERIALS CHEMISTRY AND PHYSICS
Ideality factor and threshold voltage in laser diodes2014Vanzi M; MURA G; Marcello G
Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress2014Meneghini M; Carraro S; Meneghesso G; Trivellin N; Mura G; Rossi F; Salviati G; Holc K; Weig T; S...chade L; Karunakaran M; Wagner J; Schwarz U T; Zanoni ESPIE, the international society for optics and photonics
Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis2014Barbato M.; Meneghini M; Cester A; MURA G; Zanoni E; Meneghesso GIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
FIB-induced electro-optical alterations in a DFB InP laser diode2014Mura G; Vanzi M; Marcello GMICROELECTRONICS RELIABILITY
Reliability prediction and real world for LED lamps2014MURA G; VANZI MIEEE (Institute of Electrical and Electronics Engineers, Inc.)
Degradation mechanisms and lifetime of state-of-the-art green laser diodes2015Marioli, M; Meneghini, M; Rossi, F; Salviati, G; de Santi, C; Mura, G; Meneghesso, G; Zanoni EPHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE
   
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