Prodotti della ricerca
UNICA IRIS Institutional Research Information System
IRIS è il sistema di gestione integrata dei dati della ricerca (persone, progetti, pubblicazioni, attività) adottato dall'Università degli Studi di Cagliari dal mese di luglio 2015.
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Peculiar failure mechanisms in GaN power transistors | 2020 | Vanzi, M.; Mura, G. | MICROELECTRONICS RELIABILITY | |
| Analysis of counterfeit electronics | 2020 | Mura, G.; Murru, R.; Martines, G. | MICROELECTRONICS RELIABILITY | |
| Optical gain in laser diodes with null reflectivity | 2019 | Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. | MICROELECTRONICS RELIABILITY | |
| Further improvements of an extended Hakki-Paoli method | 2018 | Vanzi, M.; Mura, G.; Martines, G. | MICROELECTRONICS RELIABILITY | |
| Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices | 2018 | Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno | JOURNAL OF ELECTRONIC MATERIALS | |
| Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes | 2018 | Vanzi, M.; Mura, G.; Sanna Valle, V. | SPIE | |
| From automotive to space qualification: Overlaps, gaps and possible convergence | 2018 | Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G. | IEEE (Institute of Electrical and Electronics Engineers) | |
| Reliability concerns from the gray market | 2018 | Mura, Giovanna | MICROELECTRONICS RELIABILITY | |
| Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers | 2017 | Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. | IEEE (Institute of Electrical and Electronics Engineers) | |
| Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress | 2017 | De Santi, Carlo; Meneghini, Matteo; Renso, Nicola; Buffolo, Matteo; Trivellin, Nicola; Mura, Giov...anna; Vanzi, Massimo; Migliori, Andrea; Morandi, Vittorio; Meneghesso, Gaudenzio; Zanoni, Enrico | PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING | SPIE |
| Practical optical gain by an extended Hakki-Paoli method | 2017 | Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. | MICROELECTRONICS RELIABILITY | |
| Analytical model for the I-V characteristics of fresh and degraded commercial LEDs | 2017 | Mura, G.; E., Miranda | ||
| Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities | 2017 | Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M. | MICROELECTRONICS RELIABILITY | |
| Extended Modal Gain Measurement in DFB Laser Diodes | 2017 | Vanzi, M; Marcello, G; Mura, G; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L | IEEE PHOTONICS TECHNOLOGY LETTERS | |
| Analysis of GaN based high-power diode lasers after singular degradation events | 2017 | Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. | PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS | |
| ESD tests on 850 nm GaAs-based VCSELs | 2016 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K. | MICROELECTRONICS RELIABILITY | |
| Single Event Transient acquisition and mapping for space device Characterization | 2016 | Pilia, Roberta; Bascoul, Guillaume; Sanchez, Kevin; Mura, Giovanna; Infante, Fulvio | MICROELECTRONICS RELIABILITY | |
| Logics of Failure Analysis: 20 Years of rules of the Rue Morgue | 2016 | Mura, Giovanna; Vanzi, Massimo | Institute of Electrical and Electronics Engineers Inc. | |
| Reverse bias degradation of metal wrap through silicon solar cells | 2016 | Barbato, M.; Barbato, A.; Meneghini, M.; Cester, A.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cell...ere, G.; Meneghesso, G. | SOLAR ENERGY MATERIALS AND SOLAR CELLS | |
| Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes | 2016 | De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Ga...udenzio; Zanoni, Enrico | IEEE TRANSACTIONS ON NANOTECHNOLOGY | |
| Side-Mode Excitation in Single-Mode Laser Diodes | 2016 | Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | |
| Clamp voltage and ideality factor in laser diodes | 2015 | Vanzi, M.; Mura, G.; Marcello, G.; Martines, G. | MICROELECTRONICS RELIABILITY | |
| Proton irradiation effects on commercial laser diodes | 2015 | Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, ...Alessandro | Institute of Electrical and Electronics Engineers Inc. | |
| Reliability issues in Optical Emitters | 2015 | Vanzi, Massimo; Mura, Giovanna | IEEE Computer Society | |
| Stress-induced instabilities of shunt paths in high efficiency MWT solar cells | 2015 | Barbato, M. ; Meneghini, M. ; Cester, A. ; Barbato, A. ; Zanoni, E. ; Meneghesso, G. ; Mura, G. ;... Tonini, D. ; Voltan, A. ; Cellere, G. | ||
| Degradation mechanisms and lifetime of state-of-the-art green laser diodes | 2015 | Marioli, M; Meneghini, M; Rossi, F; Salviati, G; de Santi, C; Mura, G; Meneghesso, G; Zanoni E | PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE | |
| Ideality factor and threshold voltage in laser diodes | 2014 | Vanzi M; MURA G; Marcello G | ||
| Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress | 2014 | Meneghini M; Carraro S; Meneghesso G; Trivellin N; Mura G; Rossi F; Salviati G; Holc K; Weig T; S...chade L; Karunakaran M; Wagner J; Schwarz U T; Zanoni E | SPIE, the international society for optics and photonics | |
| Reliability prediction and real world for LED lamps | 2014 | MURA G; VANZI M | IEEE (Institute of Electrical and Electronics Engineers, Inc.) | |
| Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis | 2014 | Barbato M.; Meneghini M; Cester A; MURA G; Zanoni E; Meneghesso G | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | |
| FIB-induced electro-optical alterations in a DFB InP laser diode | 2014 | Mura G; Vanzi M; Marcello G | MICROELECTRONICS RELIABILITY | |
| Faulty failure analyses | 2013 | MURA G; VANZI M | IEEE | |
| The role of the optical trans-characteristics in laser diode analysis | 2013 | Mura G.; VANZI M; Marcello G.; Cao R. | MICROELECTRONICS RELIABILITY | |
| Optical losses in single-mode laser diodes | 2013 | Vanzi M; Mura G.; Marongiu M.; Tomasi T. | MICROELECTRONICS RELIABILITY | |
| “Hot-plugging” of led modules: electrical characterization and device degradation | 2013 | Dal Lago M; Meneghini M; Trivellin N; Mura G; Vanzi M; Meneghesso G; Zanoni E | MICROELECTRONICS RELIABILITY | |
| Early stages of the mechanical alloying of TiC-TiN powder mixtures | 2013 | Mura G; Musu E; Delogu F | MATERIALS CHEMISTRY AND PHYSICS | |
| Thermal and electrical investigation of the reverse bias degradation of silicon solar cells | 2013 | COMPAGNIN A; MENEGHINI M; BARBATO M; GILIBERTO V; CESTER A; VANZI M; MURA G; ZANONI E; MENEGHESSO G | MICROELECTRONICS RELIABILITY | |
| Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi | 2013 | Musu E.; MURA G; Ligios G.; Delogu F. | JOURNAL OF ALLOYS AND COMPOUNDS | |
| Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence | 2013 | M. MENEGHINI; S. CARRARO; G. MENEGHESSO; N. TRIVELLIN; MURA G; F. ROSSI; G. SALVIATI; K. HOLC; T.... WEIG; L. SCHADE; M. A. KARUNAKARAN; J. WAGNER; U. T. SCHWARZ; AND E. ZANONI | APPLIED PHYSICS LETTERS | |
| Chip and package-related degradation of high power white LEDs | 2012 | Meneghini M; Dal Lago M; Trivellin N; MURA G; Vanzi M; Menegnesso G; Zanoni E | MICROELECTRONICS RELIABILITY | |
| MIM Capacitor_related early-stage field failures | 2012 | LU J; CAO B; WU W; DAI Y; HUANG C; MURA G | MICROELECTRONICS RELIABILITY | |
| Phosphors for LED-based light sources: Thermal properties and reliability issues | 2012 | Dal Lago M; Meneghini M; Trivellin N; Mura G; Vanzi M; Meneghesso G; Zanoni E | MICROELECTRONICS RELIABILITY | |
| External cavity ITLA degradation | 2012 | MURA G; M.Vanzi; G.Martines; T.Tomasi; R.Cao; M.Marongiu | ||
| A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps | 2012 | M. Meneghini; M. Bertin; G. dal Santo; A. Stocco; A. Chini; D. Marcon; P.E. Malinowski; MURA G; E.... Musu; M. Vanzi; G. Meneghesso; E. Zanoni | ||
| DC parameters for laser diodes from experimental curves | 2011 | Vanzi M; Mura G; Martines G | MICROELECTRONICS RELIABILITY | Elsevier |
| Degradation mechanisms of white LEDs for lighting applications | 2010 | M.MENEGHINI; M. DAL LAGO; L. RODIGHIERO; MURA G; M. VANZI; G. MENEGHESSO | ||
| Faulty Failure Analyses | 2010 | G.MURA; VANZI M | ||
| A review on the physical mechanisms that limit the reliability of GaN-based LEDs | 2010 | MATTEO MENEGHINI; AUGUSTO TAZZOLI; GAUDENZIO MENEGHESSO; MURA GIOVANNA; ENRICO ZANONI | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis | 2010 | Mura G; Vanzi M | MICROELECTRONICS RELIABILITY | |
| Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs | 2009 | Meneghesso G; Meneghini M; Trivellin N; Rodighiero L; Mura G; Vanzi M; Zanoni E |
