Prodotti della ricerca
UNICA IRIS Institutional Research Information System
IRIS è il sistema di gestione integrata dei dati della ricerca (persone, progetti, pubblicazioni, attività) adottato dall'Università degli Studi di Cagliari dal mese di luglio 2015.
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Are Soft-Breakdown and Hard-Breakdown of thin gate oxides actually different failure mechanism | 2000 | J. SUÑÈ; MURA G; E. MIRANDA | IEEE ELECTRON DEVICE LETTERS | |
| An automated lifetest equipment for optical emitters | 2002 | GIGLIO M; MARTINES G; MURA G; PODDA S; VANZI M | MICROELECTRONICS RELIABILITY | |
| Electrical and structural characterization of metal contacts on Gallium Nitride | 2002 | Bonfiglio A; Macis E; Mura G; Sanna O | ||
| Failure modes and mechanisms of DC-aged GaN LEDs | 2002 | Meneghesso G; Levada S; Zanoni E; Podda S; Mura G; Vanzi M; Cavallini A; Castaldini A; Du S; Elia...shevich I | ||
| Backside Failure Analysis of GaAs ICs after EDS tests | 2002 | Meneghesso, G; Cocco, A; Mura, Giovanna; Podda, Simona; Vanzi, Massimo | MICROELECTRONICS RELIABILITY | |
| Failure modes and mechanisms of DC-aged GaN LEDs | 2002 | Meneghesso, G.; Levada, S.; Zanoni, E.; Podda, S.; Mura, G.; Vanzi, M.; Cavallini, A.; Castaldini..., A.; Du, S.; Eliashevich, I. | PHYSICA STATUS SOLIDI. A, APPLIED RESEARCH | |
| ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology | 2002 | L. SPONTON; L.CERATI; G.CROCE; MURA G; S.PODDA; M.VANZI; G. MENEGHESSO | MICROELECTRONICS RELIABILITY | |
| On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices | 2003 | MURA G; VANZI M; CIAPPA M; STANGONI M; FICHTNER W | MICROELECTRONICS RELIABILITY | |
| Reliability of visible GaN LEDs in plastic package | 2003 | G. MENEGHESSO; S. LEVADA; E. ZANONI; G. SCAMARCIO; G. MURA; PODDA S; M. VANZI; S. DU; I. ELIASHE...VICH | MICROELECTRONICS RELIABILITY | |
| Analysis of RFIC Amplifiers | 2004 | MURA G; M.VANZI; G. MICHELETTI | MICROELECTRONICS RELIABILITY | |
| Failure analysis of RFIC Amplifiers | 2004 | VANZI M; MICHELETTI G.; MURA G. | MICROELECTRONICS RELIABILITY | |
| Reliability predictions in electronic industrial applications | 2005 | Cassanelli G; Mura G; Cesaretti F; Vanzi M; Fantini F | MICROELECTRONICS RELIABILITY | |
| Brightness InGaN LEDs degradation at high injection current bias | 2006 | LEVADA S; MENEGHINI M; ZANONI E; BUSO S; SPIAZZI G; MENEGHESSO G; PODDA S; MURA G; VANZI M | ||
| Failure Analysis And Field Failures: A Real Shortcut To Reliability Improvements | 2006 | MURA G; G. Cassanelli | ||
| High Brightness InGaN LEDs degradation at high injection current bias | 2006 | S. Levada; M. Meneghini; E. Zanoni; S. Buso; G. Spiazzi; Meneghesso G; MURA G; S. Podda; M. Vanzi | ||
| The rules of the Rue Morgue: a decade later | 2006 | MURA G; VANZI M; CASSANELLI G; FANTINI F | ||
| Failure Analysis-assisted FMEA | 2006 | CASSANELLI G; FANTINI F; MURA G; VANZI M; PLANO B | MICROELECTRONICS RELIABILITY | |
| Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later | 2007 | Mura G; Vanzi M | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | |
| High temperature electro-optical degradation of InGaN/GaN HBLEDs | 2007 | M. MENEGHINI; L. TREVISANELLO; C. SANNA; G. MURA; G. MENEGHESSO; VANZI M; ZANONI E. | MICROELECTRONICS RELIABILITY | |
| Thermal stability analysis of High Brightness LED during high temperature and electrical aging | 2007 | L.R. Trevisanello; M. Meneghini; MURA G; C. Sanna; S. Buso; G. Spiazzi; M. Vanzi; G. Meneghesso; ...E. Zanoni | ||
| Accelerated Life Test of High Brightness Light Emitting Diodes | 2008 | L. TREVISANELLO; M. MENEGHINI; MURA G; M. VANZI; M. PAVESI; G. MENEGHESSO; E. ZANONI | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | |
| Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels | 2008 | MURA G; L. TREVISANELLO; M. VANZI; G. MENEGHESSO; E. ZANONI | ||
| Failure Analysis of High Power White LEDs | 2008 | G. CASSANELLI; F. FANTINI; MURA G | ||
| Sulfur-contamination of High Power White LEDs | 2008 | MURA G; CASSANELLI G; FANTINI F; VANZI M | MICROELECTRONICS RELIABILITY | |
| Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs | 2009 | Meneghesso G; Meneghini M; Trivellin N; Rodighiero L; Mura G; Vanzi M; Zanoni E | ||
| Lot reliability issues in commercial off the shelf (COTS) microelectronic devices | 2009 | MURA G; VANZI M | MICROELECTRONICS RELIABILITY | |
| Faulty Failure Analyses | 2010 | G.MURA; VANZI M | ||
| The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis | 2010 | Mura G; Vanzi M | MICROELECTRONICS RELIABILITY | |
| Degradation mechanisms of white LEDs for lighting applications | 2010 | M.MENEGHINI; M. DAL LAGO; L. RODIGHIERO; MURA G; M. VANZI; G. MENEGHESSO | ||
| A review on the physical mechanisms that limit the reliability of GaN-based LEDs | 2010 | MATTEO MENEGHINI; AUGUSTO TAZZOLI; GAUDENZIO MENEGHESSO; MURA GIOVANNA; ENRICO ZANONI | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| DC parameters for laser diodes from experimental curves | 2011 | Vanzi M; Mura G; Martines G | MICROELECTRONICS RELIABILITY | Elsevier |
| A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps | 2012 | M. Meneghini; M. Bertin; G. dal Santo; A. Stocco; A. Chini; D. Marcon; P.E. Malinowski; MURA G; E.... Musu; M. Vanzi; G. Meneghesso; E. Zanoni | ||
| Chip and package-related degradation of high power white LEDs | 2012 | Meneghini M; Dal Lago M; Trivellin N; MURA G; Vanzi M; Menegnesso G; Zanoni E | MICROELECTRONICS RELIABILITY | |
| MIM Capacitor_related early-stage field failures | 2012 | LU J; CAO B; WU W; DAI Y; HUANG C; MURA G | MICROELECTRONICS RELIABILITY | |
| Phosphors for LED-based light sources: Thermal properties and reliability issues | 2012 | Dal Lago M; Meneghini M; Trivellin N; Mura G; Vanzi M; Meneghesso G; Zanoni E | MICROELECTRONICS RELIABILITY | |
| External cavity ITLA degradation | 2012 | MURA G; M.Vanzi; G.Martines; T.Tomasi; R.Cao; M.Marongiu | ||
| Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi | 2013 | Musu E.; MURA G; Ligios G.; Delogu F. | JOURNAL OF ALLOYS AND COMPOUNDS | |
| Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence | 2013 | M. MENEGHINI; S. CARRARO; G. MENEGHESSO; N. TRIVELLIN; MURA G; F. ROSSI; G. SALVIATI; K. HOLC; T.... WEIG; L. SCHADE; M. A. KARUNAKARAN; J. WAGNER; U. T. SCHWARZ; AND E. ZANONI | APPLIED PHYSICS LETTERS | |
| Optical losses in single-mode laser diodes | 2013 | Vanzi M; Mura G.; Marongiu M.; Tomasi T. | MICROELECTRONICS RELIABILITY | |
| “Hot-plugging” of led modules: electrical characterization and device degradation | 2013 | Dal Lago M; Meneghini M; Trivellin N; Mura G; Vanzi M; Meneghesso G; Zanoni E | MICROELECTRONICS RELIABILITY | |
| The role of the optical trans-characteristics in laser diode analysis | 2013 | Mura G.; VANZI M; Marcello G.; Cao R. | MICROELECTRONICS RELIABILITY | |
| Faulty failure analyses | 2013 | MURA G; VANZI M | IEEE | |
| Thermal and electrical investigation of the reverse bias degradation of silicon solar cells | 2013 | COMPAGNIN A; MENEGHINI M; BARBATO M; GILIBERTO V; CESTER A; VANZI M; MURA G; ZANONI E; MENEGHESSO G | MICROELECTRONICS RELIABILITY | |
| Early stages of the mechanical alloying of TiC-TiN powder mixtures | 2013 | Mura G; Musu E; Delogu F | MATERIALS CHEMISTRY AND PHYSICS | |
| Ideality factor and threshold voltage in laser diodes | 2014 | Vanzi M; MURA G; Marcello G | ||
| Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress | 2014 | Meneghini M; Carraro S; Meneghesso G; Trivellin N; Mura G; Rossi F; Salviati G; Holc K; Weig T; S...chade L; Karunakaran M; Wagner J; Schwarz U T; Zanoni E | SPIE, the international society for optics and photonics | |
| Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis | 2014 | Barbato M.; Meneghini M; Cester A; MURA G; Zanoni E; Meneghesso G | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | |
| FIB-induced electro-optical alterations in a DFB InP laser diode | 2014 | Mura G; Vanzi M; Marcello G | MICROELECTRONICS RELIABILITY | |
| Reliability prediction and real world for LED lamps | 2014 | MURA G; VANZI M | IEEE (Institute of Electrical and Electronics Engineers, Inc.) | |
| Degradation mechanisms and lifetime of state-of-the-art green laser diodes | 2015 | Marioli, M; Meneghini, M; Rossi, F; Salviati, G; de Santi, C; Mura, G; Meneghesso, G; Zanoni E | PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE |
