Prodotti della ricerca
Titolo: | A first generation x-ray microtomography system for non-destructive materials testing |
Autori: | |
Data di pubblicazione: | 1996 |
Abstract: | The purpose of this paper is to describe the prototype of a first generation X-ray microtomograph for the non-destructive testing of mechanical components. Following a brief presentation of the system, characterisation tests, the purpose of which is to highlight the system's limits and sphere of applicability, are discussed. Some significant results are then illustrated. |
Handle: | http://hdl.handle.net/11584/10283 |
Tipologia: | 4.1 Contributo in Atti di convegno |
File in questo prodotto:
File | Descrizione | Tipologia | Licenza | |
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Aias96_1.pdf | Articolo principale | versione editoriale | Open Access Visualizza/Apri |