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UNICA IRIS Institutional Research Information System

IRIS è il sistema di gestione integrata dei dati della ricerca (persone, progetti, pubblicazioni, attività) adottato dall'Università degli Studi di Cagliari dal mese di luglio 2015.

Mostra risultati da 21 a 40 di 114
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TitoloData di pubblicazioneAutore(i)RivistaEditore
Ideality factor and threshold voltage in laser diodes2014Vanzi M; MURA G; Marcello G
FIB-induced electro-optical alterations in a DFB InP laser diode2014Mura G; Vanzi M; Marcello GMICROELECTRONICS RELIABILITY
Reliability prediction and real world for LED lamps2014MURA G; VANZI MIEEE (Institute of Electrical and Electronics Engineers, Inc.)
The role of the optical trans-characteristics in laser diode analysis2013Mura G.; VANZI M; Marcello G.; Cao R.MICROELECTRONICS RELIABILITY
“Hot-plugging” of led modules: electrical characterization and device degradation2013Dal Lago M; Meneghini M; Trivellin N; Mura G; Vanzi M; Meneghesso G; Zanoni EMICROELECTRONICS RELIABILITY
Optical losses in single-mode laser diodes2013Vanzi M; Mura G.; Marongiu M.; Tomasi T.MICROELECTRONICS RELIABILITY
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells2013COMPAGNIN A; MENEGHINI M; BARBATO M; GILIBERTO V; CESTER A; VANZI M; MURA G; ZANONI E; MENEGHESSO GMICROELECTRONICS RELIABILITY
XEBIC at the Dual Beam2013Vanzi M; Podda S; Musu E; Cao RMICROELECTRONICS RELIABILITY
Faulty failure analyses2013MURA G; VANZI MIEEE
Phosphors for LED-based light sources: Thermal properties and reliability issues2012Dal Lago M; Meneghini M; Trivellin N; Mura G; Vanzi M; Meneghesso G; Zanoni EMICROELECTRONICS RELIABILITY
Chip and package-related degradation of high power white LEDs2012Meneghini M; Dal Lago M; Trivellin N; MURA G; Vanzi M; Menegnesso G; Zanoni EMICROELECTRONICS RELIABILITY
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps2012M. Meneghini; M. Bertin; G. dal Santo; A. Stocco; A. Chini; D. Marcon; P.E. Malinowski; MURA G; E.... Musu; M. Vanzi; G. Meneghesso; E. Zanoni
External cavity ITLA degradation2012MURA G; M.Vanzi; G.Martines; T.Tomasi; R.Cao; M.Marongiu
Implementation of TV-rate EBIC at a Dual BEam2011VANZI M; Podda S.; Tatti F.
An original DoE-based tool for silicon photodetectors EoL estimation in space environments2011Vanzi M; Spezzigu P; Bechou L; Quadri G; Gilard O; Ousten YMICROELECTRONICS RELIABILITYElsevier
DC parameters for laser diodes from experimental curves2011Vanzi M; Mura G; Martines GMICROELECTRONICS RELIABILITYElsevier
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics2011Vanzi M; Podda SElisabetta Falcieri
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis2010Mura G; Vanzi MMICROELECTRONICS RELIABILITY
Degradation mechanisms of white LEDs for lighting applications2010M.MENEGHINI; M. DAL LAGO; L. RODIGHIERO; MURA G; M. VANZI; G. MENEGHESSO
Optimized "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment2010QUADRI G; P. SPEZZIGU; C. CADDEO; O. GILARD; L. BECHOU; VANZI M
   
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