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IRIS è il sistema di gestione integrata dei dati della ricerca (persone, progetti, pubblicazioni, attività) adottato dall'Università degli Studi di Cagliari dal mese di luglio 2015.

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TitoloData di pubblicazioneAutore(i)RivistaEditore
Optical gain in laser diodes with null reflectivity2019Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y.MICROELECTRONICS RELIABILITY
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices2018Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, BrunoJOURNAL OF ELECTRONIC MATERIALS
Further improvements of an extended Hakki-Paoli method2018Vanzi, M.; Mura, G.; Martines, G.MICROELECTRONICS RELIABILITY
Reliability concerns from the gray market2018Mura, GiovannaMICROELECTRONICS RELIABILITY
From automotive to space qualification: Overlaps, gaps and possible convergence2018Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G.Institute of Electrical and Electronics Engineers Inc.
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes2018Vanzi, M.; Mura, G.; Sanna Valle, V.SPIE
Extended Modal Gain Measurement in DFB Laser Diodes2017Vanzi, M; Marcello, G; Mura, G; Le Gales, G; Joly, S; Deshayes, Y; Bechou, LIEEE PHOTONICS TECHNOLOGY LETTERS
Analysis of GaN based high-power diode lasers after singular degradation events2017Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W.PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities2017Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M.MICROELECTRONICS RELIABILITY
Practical optical gain by an extended Hakki-Paoli method2017Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L.MICROELECTRONICS RELIABILITY
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs2017Mura, G.; E., Miranda
Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress2017De Santi, Carlo; Meneghini, Matteo; Renso, Nicola; Buffolo, Matteo; Trivellin, Nicola; Mura, Giov...anna; Vanzi, Massimo; Migliori, Andrea; Morandi, Vittorio; Meneghesso, Gaudenzio; Zanoni, EnricoPROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERINGSPIE
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers2017Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M.Institute of Electrical and Electronics Engineers Inc.
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes2016De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Ga...udenzio; Zanoni, EnricoIEEE TRANSACTIONS ON NANOTECHNOLOGY
Side-Mode Excitation in Single-Mode Laser Diodes2016Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, GiovannaIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue2016Mura, Giovanna; Vanzi, MassimoInstitute of Electrical and Electronics Engineers Inc.
Single Event Transient acquisition and mapping for space device Characterization2016Pilia, Roberta; Bascoul, Guillaume; Sanchez, Kevin; Mura, Giovanna; Infante, FulvioMICROELECTRONICS RELIABILITY
ESD tests on 850 nm GaAs-based VCSELs2016Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K.MICROELECTRONICS RELIABILITY
Reverse bias degradation of metal wrap through silicon solar cells2016Barbato, M.; Barbato, A.; Meneghini, M.; Cester, A.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cell...ere, G.; Meneghesso, G.SOLAR ENERGY MATERIALS AND SOLAR CELLS
Reliability issues in Optical Emitters2015Vanzi, Massimo; Mura, GiovannaIEEE Computer Society
   
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