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IRIS è il sistema di gestione integrata dei dati della ricerca (persone, progetti, pubblicazioni, attività) adottato dall'Università degli Studi di Cagliari dal mese di luglio 2015.

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TitoloData di pubblicazioneAutore(i)RivistaEditore
Optical gain in laser diodes with null reflectivity2019Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y.MICROELECTRONICS RELIABILITY
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices2018Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, BrunoJOURNAL OF ELECTRONIC MATERIALS
Further improvements of an extended Hakki-Paoli method2018Vanzi, M.; Mura, G.; Martines, G.MICROELECTRONICS RELIABILITY
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes2018Vanzi, M.; Mura, G.; Sanna Valle, V.SPIE
Extended Modal Gain Measurement in DFB Laser Diodes2017Vanzi, M; Marcello, G; Mura, G; Le Gales, G; Joly, S; Deshayes, Y; Bechou, LIEEE PHOTONICS TECHNOLOGY LETTERS
Analysis of GaN based high-power diode lasers after singular degradation events2017Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W.PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS
Practical optical gain by an extended Hakki-Paoli method2017Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L.MICROELECTRONICS RELIABILITY
Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress2017De Santi, Carlo; Meneghini, Matteo; Renso, Nicola; Buffolo, Matteo; Trivellin, Nicola; Mura, Giov...anna; Vanzi, Massimo; Migliori, Andrea; Morandi, Vittorio; Meneghesso, Gaudenzio; Zanoni, EnricoPROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERINGSPIE
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers2017Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M.Institute of Electrical and Electronics Engineers Inc.
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes2016De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Ga...udenzio; Zanoni, EnricoIEEE TRANSACTIONS ON NANOTECHNOLOGY
Side-Mode Excitation in Single-Mode Laser Diodes2016Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, GiovannaIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue2016Mura, Giovanna; Vanzi, MassimoInstitute of Electrical and Electronics Engineers Inc.
Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre2016Mannu, C.; Rodriguez, G.; Vanzi, . M.Condaghes
ESD tests on 850 nm GaAs-based VCSELs2016Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K.MICROELECTRONICS RELIABILITY
Reliability issues in Optical Emitters2015Vanzi, Massimo; Mura, GiovannaIEEE Computer Society
Clamp voltage and ideality factor in laser diodes2015Vanzi, M.; Mura, G.; Marcello, G.; Martines, G.MICROELECTRONICS RELIABILITY
Recent improvements in photometric stereo for rock art 3D imaging2015Dessì R; Mannu C; Rodriguez G; Tanda G; Vanzi MDIGITAL APPLICATIONS IN ARCHAEOLOGY AND CULTURAL HERITAGE
Proton irradiation effects on commercial laser diodes2015Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, ...AlessandroInstitute of Electrical and Electronics Engineers Inc.
Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna2015Mannu, C; Rodriguez, Giuseppe; Tanda, Giuseppa; Vanzi, MassimoEdizioni del Centro - Centro Camuno di Studi Preistorici
Photometric stereo for 3D mapping of carvings and relieves: case studies on prehistorical art in Sardinia2014Vanzi, M; Mannu, C; Dessì, R; Rodriguez, G; Tanda, GÂNGULO
   
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